X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating
نویسندگان
چکیده
A technique for measuring interdiffusion in multilayer materials during rapid heating using X-ray reflectivity is described. In this technique the sample is bent to achieve a range of incident angles simultaneously, and the scattered intensity is recorded on a fast high-dynamic-range mixed-mode pixel array detector. Heating of the multilayer is achieved by electrical resistive heating of the silicon substrate, monitored by an infrared pyrometer. As an example, reflectivity data from Al/Ni heated at rates up to 200 K s-1 are presented. At short times the interdiffusion coefficient can be determined from the rate of decay of the reflectivity peaks, and it is shown that the activation energy for interdiffusion is consistent with a grain boundary diffusion mechanism. At longer times the simple analysis no longer applies because the evolution of the reflectivity pattern is complicated by other processes, such as nucleation and growth of intermetallic phases.
منابع مشابه
Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers
The interplay between optical performance and the thermally activated interface chemistry of periodic Mg/SiC multilayers designed for application at 30.4 nm are investigated by optical (hard x-ray, soft x-ray and ultraviolet ranges, i.e. from 0.154 to 30.4 nm) reflectivity and x-ray emission spectroscopy. The multilayers are prepared by magnetron sputtering and then annealed up to a temperature...
متن کاملDetermination of layer structure in Mo/Si multilayers using soft X-ray reflectivity
The soft X-ray reflectivity characterization of Mo/Si multilayer deposited by electron beam evaporation is discussed. The measurements are performed on Indus-1 synchrotron storage ring. The interdiffusion of two-layer materials in multilayer leads to the formation of interlayers. To understand the influence of interlayers and interfacial roughness on soft X-ray reflectivity profile, simulation ...
متن کاملGrowth and Nano-structural Studies of Metallic Multilayers for X-ray Mirrors
A part of the Ph.D. project focused on growth and characterization of metal multilayers is presented in this licentiate thesis. The main interest in carrying out this research is to develop highly reflective normal-incidence condenser mirrors for soft X-ray microscopy studies in the water window (λ = 2.4− 4.2 nm) wavelength regime. Transition metals like Sc, Ti V, etc. have been considered beca...
متن کاملA Simple Closed-form Expression for the X-ray Reflectivity from Multilayers with Cumulative Roughness
We present a simple closed-form expression for the reflectivity horn a multilayer which includes the effects of absorption, refraction, surface and substrate reflections but neglects dynamical effects. This expression reproduces the exact dynamical calculation except for the regions near the critical angle and for intense Bragg reflections. The expression is generalized to include cumulative in...
متن کامل